DetailEvolution of Interaction – Consistent. Clear. Comprehensive.
This month we celebrate a special event at SPECS: The 100th Major release of SpecsLab Prodigy.
Back in 2014 (on the 16th of April to be precise), SPECS released the first version of SpecsLab Prodigy, the successor to the long-running SpecsLab 2 control suite. With the aim of providing a simple, stable and up-to-date software environment, we have been constantly working to improve our software to meet the needs of the community. Originally starting with basic XPS measurements, Specslab Prodigy has been expanded to include many features, controlled devices and tasks. These include hosting complex imaging and mapping techniques, sophisticated data analysis and growing instrument and system control. The list is almost too long to cover. But here are some of the key features that have been added to SpecsLab Prodigy so far.
What does the future hold? As you read this article, our software team is already working on version 101. What features will be included depends on you. Your feedback and suggestions are valuable to us. Contact us at info@specs.com or contact your local sales and service partner if you have any needs you would like to see addressed in our software. Found a bug? Please report it to help our community get a stable and reliable software tool for scientific research.
Thank you for supporting us and our software for 100 major releases!
Vacuum Control
Using vacuum control, complex SPECS UHV and NAP systems can be fully automated to let the operator concentrate on the current task and keep the system in stable and reliable operation. It provides full overview of the system vacuum status and keeps the operation in a safe state. A true step towards turn key tools.
Depth Profiling
Destruction free depth profiling requires a synergetic combination of the right hardware paired with a powerful software analysis. Matching the new AEOLOS 190 analyzer and µFOCUS 450 multi wavelength x-ray source, a sophisticated depth profiling routine analyses the acquired data and matches it with an iterative adjusted structural model to obtain highest precision in surface layer characterization.
System Data Logging
The possibility of monitoring the status of the instrument over long time is allows to collect instrument Health data through experiments, to clearly address irregularities or identify anomalies in the acquired data. The live view of system parameters assists critical steps, such as alignment while watching the signal intensity while optimizing the sample position.
Multi Dimensional Data Viewer
Multidimensional data acquisition, time resolved experiments or microscopy applications need a sophisticated data inspection tool. The Image viewer is a multi-dimensional data inspection tool with data analysis and correction function. Some important applications include the view of microscopy data, Handling of time resolved datasets or transformation or ARPES DATA into k-space data.
Remote Operation
Many experiments rely on integrating novel devices or home-built control Units. The Remote in and out programming interface is was go natively integrate external devices into SpecsLab Prodigy. In this way custom experiments are possible beyond any predefined routine.
Measurement Customization
There is no way of imagining what needs to be done before a task comes up. Automation and customization is an integral feature of SpecsLab Prodigy to ensure flexibility in setting up measurement tasks. Like programming, it features all basic ingredients for a responsive interaction with the machine, including loops, user interaction prompts, parameter dependent start and stop features and intelligent measurement automation.
KeyStone
All needs above being available for researchers, are distilled and condensed into Keystone, the interface for maximum productivity and ease of use. Keystone is the interface for the ENVIRO brand of SPECS, hence being available in the EnviroESCA and EnviroMETROS. It is tuned for the specific needs of the instrument and provides a distraction free interaction with the instrument and its devices.
