Detail

Photovoltaics

Thin film solar cells are cheap in production at reasonable efficiencies. The multi-layer structure contains many heterojunctions. The band alignment and doping is important for the efficiency, while the chemical interface properties are a measure for the lifetime. Both can be probed by XPS and UPS, best in an integrated multimethod system with thin film deposition methods integrated.

RELATED PRODUCTS

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AEOLOS 150 AD-CMOS

High transmission wide angle hemispherical energy analyzer

Power Supply for FG 22/35

Robust and Simple UV Source

Function generator

Single or dual-channel function generator driving all outputs of the SC5 and SO5

Mimea upgrade for OC4.5 station

Upgrade from a standalone PLL to a full SPM control system

Mimea upgrade from BP4 to BP5e

Trade-in your V4 controller and get the newest V5e system

Mimea upgrade from BP3 to BP5e

Trade-in your V3 controller and get the newest V5e system

Signal adder 4

For spectroscopy measurements with external lock-ins

Scripting module

Script your own high-speed measurement sequences

STM simulator

Your test and training environment for SPM experiments

Plenty of outputs for multiprobe applications (for BP5/BP5e)

Plenty of signals for extended data Acquisition (for BP5/BP)

Programming interface

Nanonis programming interface PI 5

PMD4-BNC adapter

BNC adapter for PMD4

PMD4 piezo motor driver

High current piezo motor driver

Oscillation Control Software

The new cockpit for AFM experiments

Software upgrade to Nanonis Tramea

Switch between scanning probe and quantum transport

Z modulator

Adds an AC modulation to the Z high voltage signal

UVS 300 Small Spot

High Perfomance VUV Light Source with Small Spot Focus and High Intensity

High Performance UV Light Source

PHOIBOS 225 1D-DLD

XPS/UPS Analyzer with Delayline Detector

PHOIBOS 150 MCD

Robust XPS/UPS Analyzer with MCD Detector

PHOIBOS 150 1D-DLD

High Performance XPS/UPS Analyzer with Delayline Detector

PHOIBOS 100 MCD5 (inkl. PHOIBOS 100-63 MCD)

Hemipsherical Energy Analyzer with MCD detector for UPS, XPS

OC4.5 station

For the finest control of mechanical oscillators

Programming interface

Nanonis programming interface for OC4.5 station

OC4 oscillation controller

For the finest control of mechanical oscillators

FOCUS 500/600

Monochromatic X-Ray Source for XPS applications

SPECS KolibriPreamp

Highly reliable low noise preamplifier for KolibriSensor

FEMTO DLPCA-200

FEMTO DLPCA-200 preamp kit/cable kit

FEMTO DHPCA-100

FEMTO DHPCA-100 preamp kit/cable kit

FEMTO DDPCA-300

FEMTO DDPCA-300 preamp kit/cable kit

EQ 22/35 Electron Source

Small Spot Electron Source for AES, SEM/SAM, EELS and more.

Adaptation kit Veeco

Veeco Multimode adaptation kit

Adaptation kit Unisoku

Adaptation kit for Unisoku SPMs

Adaptation kit SPECS

Adaptation kit for SPECS Aarhus SPM

Adaptation kit Omicron

Adaptation kit for Omicron STM/AFM

Adaptation kit JEOL

Upgrade the latest JEOL SPM with a Nanonis SPM controller

Adaptation kit JEOL

For JEOL 4000 and 5200 series UHV AFM/STM

Adaptation kit Createc

Adaptation kit for Createc SPMs

MCD Detector

Channel Electron Multiplier Detector to combine with PHOIBOS 100/150/225 for XPS, UPS, ISS, LEIS measurements.

5 to 4 Quadrant adapter

Sums Z into X and Y channels for 4-quadrant piezo operation

AUX modulator

Adds an AC modulation to the AUX high voltage signal

Lock-in modules

High-performance digital lock-in amplifiers

Kelvin controller

Bias voltage regulation for contact potential measurements

Interferometer controller

For precise control of interferometric deflection detection

High-resolution oscilloscope module

High resolution oscilloscope and FFT module OS5

HVS4 high voltage power supply

High voltage power supply for HVA4, PMD4, PD5

HVA4-BNC Adapter

BNC adapter for HVA4

HVA4 High voltage amplifier

Low-noise high-voltage amplifier for piezo scanners

Generic PI controller

Configurable digital PI-Controllers GP 5

Audio Monitor AM5

The Sound of Atoms

Atom tracking

Atom tracking module for automatic drift compensation

Adaptation kit Beetle

Adaptation kit for Beetle-type SPM heads

APPLICATION NOTES

Non-destructive depth profiles by Parallel Angle-Resolved XPS (PARXPS)

Non-destructive depth profiles by Parallel Angle-Resolved XPS (PARXPS)

Parallel angle-resolved XPS is a powerful tool for obtaining non-destructive surface depth profiles of layered thin-film samples.

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