ProvenX-MM

Proven Analysis System for State-of-the-Art Momentum Microscopy

The ProvenX system series represents the quintessence of our extensive knowledge in developing and manufacturing complete surface analysis systems that fulfill the most demanding scientific requirements. This system concept combines the most required analysis techniques with the latest and proven technology for ultimate performance.

The ProvenX-MM system is a specialized systembase for momentum microscopy solutions, supporting the KREIOS 150 Series, parallel single event detectors and optional spin detection, as well as the UVS µFOCAL small spot UV source with optional monochromator. The sample handling is done by the SPECS HESTIA low temperature microscopy stage. The system comes with a dedicated preparation chamber, a clean UHV sample storage facility and a multi sample fast entry loadlock.

System control is done by the SpecsLab Prodigy software suite with integrated remote control packages, automated sample handling and a computer based vacuum control system.

The system can be equipped with an optiopnal small spot x-ray source for material characterization. Additional software and preparation tools are available.

KEY FEATURES

High Resolution Momentum Microscope
Low Temperature Sample Stage
Monochromated Small Spot UV Source
Reliable and Proven System Design
Optional Small Spot Monochromated XPS Imaging Function
Fully Automated System Control
Including Preparation Chamber, Loadlock and Sample Storage

MADE FOR THESE METHODS
SPECIFICATIONS
RELATED PRODUCTS

MADE FOR THESE METHODS

2

ARPES

Angle-Resolved Photoelectron Spectroscopy detects the energy and angle distribution of photoelectrons to determine the electronic structure of solids.

Momentum Microscopy

Momentum Microscopy and Electron Momentum Spectroscopy

SPECIFICATIONS

ProvenX-MM

Performance

Energy Resolution	< 10 meV (< 5 meV achievable) with KREIOS 150 < 25 meV with KREIOS 150 MM
k-Resolution	< 0.008 Å^-1 with KREIOS Series
Acceptance Angle	< 3.6 Å^-1 / ±90° with KREIOS Series
Sample Temperature	< 9 K with HESTIA Sample Stage
Spot Size	< 100 µm UV Spot Size with UVS µFOCAL < 250 µm X-Ray Spot Size with µFOCUS 500
Residual Magentic Field	< 0.5 µT in Analysis Chamber
Base Pressure	< 2x10^-10 mbar in Analysis and Preparation Chamber < 5x10^-8 mbar in Load Lock

Configuration

Electron Energy Analyser	SPECS KREIOS 150 Electron Momentum Spectrometer SPECS KREIOS 150 MM Momentum Microscope SPECS KREIOS 150 MM Twin Momentum Microscope
Detector	2D-CMOS True Parallel Pulse Counting Detector optional: 3D Spin Detector with VLEED or MOTT Detection Scheme Direct Imaging Spin Detector with KREIOS 150 MM
Analysis Chamber	spherical µ-metal chamber
Manipulator	HESTIA Sample Stage
Preparation Chamber	Stainless Steel Preparation Chamber Options: LEED, Surface Cleaning, Plasma Treatment, Deposition Sources
Load Lock	Fast Entry Load Lock with Sample Storage for 4 Samples
UV Source	SPECS UVS with µFOCAL capillary and optional TMM 304 UV Monochromator Hg Discharge Light Source
X-Ray Source	SPECS µFOCUS 500 X-Ray Monochromator with Al k_α Anode
Sample Storage	4 Slots in Analysis Chamber and 4 Slots in Loadlock Chamber
Vacuum Control	SPECS Vacuum Control Software for Full Vacuum System Automation
Operating Software	SpecsLab Prodigy Control Software