Logo specsDetail

Multimethod System with XPS, SPM and UHV Prepration

Multimethod System with XPS, SPM and Preparation Chamber for Wide Range of Modern Surface Science Applications

The SPECS Multimethod System with XPS, SPM and preparation chamber is a fully equipped UHV analysis system for modern surface science applications. All systems are designed and manufactured at the SPECS headquarter in Berlin. A special engineering group personally accompanies the system process from the order placing until the final acceptance. Our engineers are dedicated to highest quality and usability of the system during design, testing and setup on site. Once the system is in full operation, a professional service team in our HQ and our worldwide branch offices takes care of a smooth and stable operation.

The system consists of  XPS, SPM and preparation chambers connected to each other. The XPS system allows chemical analysis of the samples using photoelectron spectroscopy. The SPM (Scanning Probe Microscopy) system allows local surface structure analysis with atomic resolution and local spectroscopy on atomic scale. The separate preparation chamber allows integration of cleaning, growth and verification methods for the sample preparation.

The typical vacuum in SPECS systems is better than 2 x 10-10 mbar achieved during assembly at SPECS. A final end pressure in the 10-11 mbar range is achievable. The standard pumping configuration consists of and ion getter pump (IGP), a titan sublimation pump (TSP) and a turbo molecular pump (TMP) with connecting to a roughing vacuum. Different pumping configurations are available on request including cryopumps, larger pumping schemes and also NEG pumps.

All systems are equipped with a rigid frame and included bake-out tents with automated heating systems. An electronics cabinet hosts all relevant electronics, a main power supply and a TCP/IP based communication platform for the control units.

KEY FEATURES

  • XPS analysis
  • Sample preparation chamber for sample cleaning, deposition and diffraction measurements
  • Atomic resolution real space analysis with SPM
  • Open and modular system design
  • Designed and tested in Berlin, Germany

MADE FOR THESE METHODS

2
Close
Your web browser is deprecated
This could effect the presentation and some functions of our website.