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Multimethod System with XPS, LEEM and SPM

Linear Transfer System with XPS, LEEM and SPM for Wide Range of Modern Surface Science Applications

The SPECS Multimethod System with  LTS, XPS, LEEM and SPM is a fully equipped UHV analysis system for modern surface science applications. All systems are designed and manufactured at the SPECS headquarter in Berlin. A special engineering group personally accompanies the system process from the order placing until the final acceptance. Our engineers are dedicated to highest quality and usability of the system during design, testing and setup on site. Once the system is in full operation, a professional service team in our HQ and our worldwide branch offices takes care of a smooth and stable operation.

The SPECS linear transfer system (LTS) connects different satellite modules by a UHV vacuum tube with integrated sample carrier. Up to 5 slots for multiple samples can be moved automatically between the system interconnection points. The flexible design allows a cost efficient upgrade with additional transfer segments. Each segment can host up to two full scale satellite system modules. In this case, the LTS system comes with XPS, LEEM and SPM (Scanning Probe Microscopy) satellite chambers.

The LEEM  (Low Energy Electron Microscopy) system gives access to structural, chemical, electronic and magnetic properties of local dynamic surface processes. The SPM (Scanning Probe Microscopy) system allows local surface structure analysis with atomic resolution and local spectroscopy on atomic scale.

The typical vacuum in SPECS systems is better than 2 x 10-10 mbar achieved during assembly at SPECS. A final end pressure in the 10-11 mbar range is achievable. The standard pumping configuration consists of and ion getter pump (IGP), a titan sublimation pump (TSP) and a turbo molecular pump (TMP) with connecting to a roughing vacuum. Different pumping configurations are available on request including cryopumps, larger pumping schemes and also NEG pumps.

All systems are equipped with a rigid frame and included bake-out tents with automated heating systems. An electronics cabinet hosts all relevant electronics, a main power supply and a TCP/IP based communication platform for the control units.

All SPECS systems are ready for interconnections to other SPECS modules. Also the connection to existing systems can be tested on request.

KEY FEATURES

  • XPS analysis
  • Access to various structural, chemical, electronic and magnetic properties with LEEM
  • Atomic resolution real space analysis with SPM
  • Open and modular system design
  • Designed and tested in Berlin, Germany

MADE FOR THESE METHODS

3

PUBLICATIONS

  1. (2022) Advances in Analytical Instrumentation for Photoelectron Spectroscopy at Near-ambient Pressures
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  2. (2021) Stacking Relations and Substrate Interaction of Graphene on Copper Foil
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  3. (2021) Spectroscopic analysis with tender X-rays: SpAnTeX, a new AP-HAXPES end-station at BESSY II
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  4. (2020) Silicon Carbide Stacking-Order-Induced Doping Variation in Epitaxial Graphene
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  5. (2020) In situ work-function measurement during chemical transformation of MoS2 to MoO3 by ambient-pressure x-ray photoelectron spectroscopy
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  6. (2020) AP-XPS beamline, a platform for operando science at Pohang Accelerator Laboratory
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  7. (2020) Photoinduced Charge Carrier Dynamics and Electron Injection Efficiencies in Au Nanoparticle-Sensitized TiO2 Determined with Picosecond Time-Resolved X‑ray Photoelectron Spectroscopy
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  8. (2020) Identifying the Catalyst Chemical State and Adsorbed Species during Methanol Conversion on Copper Using Ambient Pressure X‐ray Spectroscopies
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  9. (2019) Ionic-Activated Chemiresistive Gas Sensors for Room-Temperature Operation
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  10. (2019) Propane dehydrogenation over vanadium-doped zirconium oxide catalysts
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  11. (2019) Cu-promoted zirconia catalysts for non-oxidative propane dehydrogenation
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  12. (2019) Efficient charge generation from triplet excitons in metal-organic heterojunctions
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  13. (2015) Low-Energy Electron Potentiometry: Contactless Imaging of Charge Transport on the Nanoscale
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  14. (2015) Time-resolved X-ray photoelectron spectroscopy techniques for thestudy of interfacial charge dynamics
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  15. (2014) Sub-nanosecond time-resolved ambient-pressure X-ray photoelectron spectroscopy setup for pulsed and constant wave X-ray light sources
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  16. (2014) Atomic-Scale Perspective of Ultrafast Charge Transfer at a Dye−Semiconductor Interface
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