The tension is rising...

...as the AVS 66 in Columbus, Ohio is approaching and by this also the launch of a new product in the field of X-ray Photoelectron Spectroscopy (XPS). If you would like to learn more about this „secret“ and would like to see the latest developments on our leading products ASTRAIOS 190, KREIOS 150, Mimea BP5e and EnviroESCA, please come by the SPECS-TII Inc. booth #401 or visit our product presentation in the exhibitor spotlight session Tuesday, Oct 22 at 12:40pm, “New Trends in Photoelectron Spectroscopy: Momentum Resolved Photoelectron Spectroscopy, Spin-resolved ARPES, Small Spot and Hard X-ray XPS” in the exhibition hall, or our scientific contribution in the symposium sessions.

Session: (Room A120-121) CA+NS+SS+VT-ThA Progress in Instrumentation and Methods for Spectro-microscopy of Interfaces
Paul Dietrich: Thursday, Oct 24 at 3:00pm, “Interfacial Studies using Ambient Pressure”

Session: (Room A211) AS+BI+RA-MoMQuantitativeSurface Analysis I/Reproducibility Issues in Quantitative XPS
Andreas Thissen, Monday Oct 21 at 10am, “How to Avoid Errors in the Interpretation of XPS”

Meet our local US team, accompanied by international product experts from SPECS, Enviro and Nanonis. For urgent support requests we also will have a dedicated service point in our booth.

We are looking forward to meeting you there. Until then, the tension is still rising...