New LEEM system at Harvard University

A new low energy electron microscope with integrated aberration correction system (FE-LEEM P90 AC) has been installed at the Center for Nanaoscale Systems within Harvard University (USA), in the research group of Professor David C. Bell of the Harvard John A. Paulson School of Engineering and Applied Sciences. The load lock was specially designed for vacuum suitcases to transfer samples from different systems under vacuum into the AC-LEEM system for analysis.

Harvard University provides an ideal environment for the specifications of the SPECS FE-LEEM P90 AC and demonstrates the outstanding performance for sample analysis processes in lateral resolution < 3nm in LEEM and < 8nm in PEEM mode in real-time. Additionally, samples will be prepared in-situ and heated from RT to 1500K by electron beam heating or cooled down to < 130K by liquid nitrogen and the LEEM/PEEM can acquire images and analyze surface changes in real time while the sample is held at any temperature. With the integrated energy filters, spectroscopic energy resolutions < 250meV are achievable, and with the adapted UVS300 UV source using HeI/II, ARPES measurements could also be demonstrated.

The easy handling of the instrument and the fast sample transfer process provide the ideal requirements for quick and detailed sample analysis.

We would like to thank Professor David C. Bell and Dr. Austin Akey for collaborating with us on this exciting project and for their trust in SPECS to seamlessly integrate the FE-LEEM P90 AC UHV system into their available analysis system structure. We would especially like to thank them for their valuable input and assistance during the many stages of the project and we wish them great success with the instrument! The FE-LEEM P90 AC system was funded by the National Science Foundation, Award Number DMR-1828237.