Detail

Graphene and 2D Materials

Graphene and 2D-materials show electronic properties, that are promising to revolutionize micro- and nanoelectronics and many related fields. ARPES, XPS, LEEM and SPM are perfectly suited to characterize these materials. The deposition and interface formation can best be studied operando by NAP-XPS and NAP-SPM.

RELATED PRODUCTS

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COSCON SUVS

Power Supply for µSIRIUS UV Source

KREIOS Twin

Next Generation Double Hemisphere Momentum Microscope

High Performance Microscopy Stage Series

ProvenX-ARPES

Proven Analysis System for State-of-the-Art ARPES

5 Axes UHV Sample Manipulators

µSIRIUS Small Spot

Next generation high intensity µFOCAL UV source

µSIRIUS Focused

Next generation high intensity small spot UV source

Direct Imaging Spin Detector

Parallel Angular and Spin Detection System

Mimea base package BP5e

The expandable engine for your SPM project

Lock-in modules

High-performance digital lock-in amplifiers

Plenty of signals for extended data Acquisition (for BP5/BP)

Plenty of outputs for multiprobe applications (for BP5/BP5e)

STM simulator

Your test and training environment for SPM experiments

Scripting module

Script your own high-speed measurement sequences

Signal adder 4

For spectroscopy measurements with external lock-ins

Plenty of signals for complex samples (for Nanonis Tramea)

Plenty of outputs for complex samples (for Nanonis Tramea)

Tramea base configuration

The expandable engine for the most demanding QT measurements

Quantum dot simulator

Your test and training environment for quantum experiments

Programming interface

Nanonis LabVIEW programming interface QT PI 5

Tramea lock-in modules

High-performance digital lock-in amplifiers

MCVA5 preamplifier

Ultra-high impedance, low noise multichannel preamplifier

OC4 oscillation controller

For the finest control of mechanical oscillators

Programming interface

Nanonis programming interface for OC4.5 station

OC4.5 station

For the finest control of mechanical oscillators

Oscillation Control Software

The new cockpit for AFM experiments

PMD4 piezo motor driver

High current piezo motor driver

PMD4-BNC adapter

BNC adapter for PMD4

Programming interface

Nanonis programming interface PI 5

Mimea upgrade from BP3 to BP5e

Trade-in your V3 controller and get the newest V5e system

Mimea upgrade from BP4 to BP5e

Trade-in your V4 controller and get the newest V5e system

Mimea upgrade for OC4.5 station

Upgrade from a standalone PLL to a full SPM control system

SEM/SAM+XPS System

SEM/SAM+XPS System for Deeper Analysis of Sample Surface

SPM Aarhus 150

Highest stability STM/AFM for ultimate productivity

SPM Aarhus 150 NAP

Highest stability STM/AFM for near ambient pressure

XPS System with UHV and High Pressure Prepration

Multimethod System with Preparation, HPC and XPS

Multimethod System with XPS, SPM and UHV Prepration

Multimethod System with Preparation, XPS and SPM

2D-CCD Detector

Detection System for Aquisition of Two Dimensional Spectroscopic and Microscopic Datasets.

Scripting tool

Script your own high-speed measurement sequences

SEM/SAM+ARXPS System

SEM/SAM+ARXPS System for Deeper Analysis of Sample Surface

Software upgrade

Switch between quantum transport and scanning probe

Software upgrade to Nanonis Tramea

Switch between scanning probe and quantum transport

Z modulator

Adds an AC modulation to the Z high voltage signal

PHOIBOS 100 2D-DLD (PHOIBOS 100-63 2D-DLD)

ARPES/XPS Analyzer with 2D-DLD Detector and 100 mm Radius

PHOIBOS 150 2D-CMOS/-CCD

The ARPES/XPS Analyzer with CMOS Detector and 150 mm Radius

PHOIBOS 150 2D-DLD

ARPES/XPS Analyzer with 2D-DLD Detector and 150 mm Radius

ASTRAIOS 190 2D-CMOS

2D Momentum Mapping Electron Analyzer for ARPES

PHOIBOS 225 2D-CMOS/-CCD

HrARPES/XPS Analyzer with 2D-CMOS Detector and 225 mm Radius

PHOIBOS 225 2D-DLD

ARPES/XPS Analyzer with 2D-DLD Detector and 100 mm Radius

Function generator

Single or dual-channel function generator driving all outputs of the SC5 and SO5

2D-CMOS Detector

CMOS Based 2D Detector for ARPES and XPS

Reverse View LEED Optics for Structural Analysis and AES

FE-LEEM/PEEM P90

High Resolution LEEM/PEEM System

FE-LEEM/PEEM P90 AC

Aberration Corrected LEEM/PEEM System

FE-LEEM/PEEM P90 NAP

Near Ambient Pressure Low Energy Electron Microscope

FEMTO DDPCA-300

FEMTO DDPCA-300 preamp kit/cable kit

FEMTO DHPCA-100

FEMTO DHPCA-100 preamp kit/cable kit

FEMTO DLPCA-200

FEMTO DLPCA-200 preamp kit/cable kit

SPECS KolibriPreamp

Highly reliable low noise preamplifier for KolibriSensor

System Module for Scanning Probe Microscopy

System Module for Photoelectron Spectroscopy

Reverse View LEED Optics for Structural Analysis and AES

Extremely Precise LT 6 Axes Manipulator For ARPES

2D-DLD Detector

2D-Delayline Detector ARPES, XPS and Imaging

Multimethod System with ARPES, LT-SPM and UHV Preparation

Multimethod ARPES/LT-SPM System for Surface Analysis

Adaptation kit Beetle

Adaptation kit for Beetle-type SPM heads

Adaptation kit Createc

Adaptation kit for Createc SPMs

Adaptation kit JEOL

For JEOL 4000 and 5200 series UHV AFM/STM

Adaptation kit JEOL

Upgrade the latest JEOL SPM with a Nanonis SPM controller

Adaptation kit Omicron

Adaptation kit for Omicron STM/AFM

Adaptation kit SPECS

Adaptation kit for SPECS Aarhus SPM

Adaptation kit Unisoku

Adaptation kit for Unisoku SPMs

Adaptation kit Veeco

Veeco Multimode adaptation kit

KREIOS 150 S

Electron Momentum Spectrometer for µ-ARPES and PEEM

KREIOS 150 MM

Next Generation Momentum Microscope

KREIOS 150 System

Turnkey System for KREIOS 150 and Next Generation ARPES

Function generator

Dual-channel function generator driving all outputs of the TSC and TSO

Generic PI controller

Configurable digital PI-Controllers GP 5

Generic PI controller

Configurable digital PI-Controllers QT GP 5

HVA4 High voltage amplifier

Low-noise high-voltage amplifier for piezo scanners

HVA4-BNC Adapter

BNC adapter for HVA4

HVS4 high voltage power supply

High voltage power supply for HVA4, PMD4, PD5

High-resolution oscilloscope module

High resolution oscilloscope and FFT module OS5

Interferometer controller

For precise control of interferometric deflection detection

Audio Monitor AM5

The Sound of Atoms

Multimethod Surface Analysis System Cluster

Multimethod Cluster with ARPES, SPM, LEEM and IonTof Qtac

Multimethod System with XPS, LEEM and SPM

Multimethod Cluster System with XPS, LEEM and SPM

TOF Momentum Microscope

METIS 1000 System

Turn Key System for TOF Momentum Microscopy

NAP-SPM system

Scanning Probe Microscope for Near Ambient Pressure

5 to 4 Quadrant adapter

Sums Z into X and Y channels for 4-quadrant piezo operation

AUX modulator

Adds an AC modulation to the AUX high voltage signal

Atom tracking

Atom tracking module for automatic drift compensation

Kelvin controller

Bias voltage regulation for contact potential measurements

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