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KREIOS 150 System

Turnkey System for KREIOS 150, MM and Twin Analyzers with UV and X-Ray Sources, Sample Transfer and Sample Manipulation.

The SPECS system for laboratory ARPES is a fully equipped UHV analysis system for modern surface analysis including ARPES and XPS. All systems are design and manufactured at the SPECS headquarter in Berlin. A special engineering group personally accompanies the system process from the order placing until the final acceptance. Our engineers are dedicated to highest quality and usability of the system during design, testing and setup on site. Once the system is in full operation a professional service team in our HQ and our worldwide branch offices takes care of a smooth and stable operation.

The system for the KREIOS analyzer series, including MM and Twin, is a turnkey system for state of the art ARPES and PEEM operation. It comes with a fully equipped system base including vibrational insulation. The system design is ready to host monochromated small spot UV and X-ray sources, sample transfer to preparation facilities and additional analysis components, such as Hg discharge light sources or camera systems. The operation with laser sources and synchrotrons is forseen and can easily be implemented in the system design. 

The typical vacuum achieved in SPECS systems is better than 2 x 10-10 mbar achieved during assembly at SPECS. A final end pressure in the 10-11 mbar range is achievable. The standard pumping configuration consist of and ion getter pump (IGP), a titan sublimation pump (TSP) and a turbo molecular pump (TMP) with connecting to a roughing vacuum. Different pumping configurations are available on request including cryo pumps, larger pumping schemes and also NEG pumps.

All Systems are equipped with a rigid frame and included bake-out tents with automated heating systems. An electronics cabinet hosts all relevant electronics, a main power supply and a TCP/IP based communication platform for the control units.

All SPECS systems are ready for interconnections to other SPECS modules. Also the connection to existing systems can be tested on request.

KEY FEATURES

  • KREIOS 150, MM and Twin Analyzers
  • Energy Resolution <9 meV
  • Lateral Resolution <100 nm
  • Small Spot ARPES down to 2 µm
  • Monochromated Small Spot UV and X-Ray Sources
  • Vibrational Insulation System
  • Open and Modular System Design
  • Designed and Tested in Berlin, Germany

MADE FOR THESE METHODS

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