Detail

Adaptation kit Veeco

The Veeco adaptation kit allows the numerous owners of a MultiMode microscope to have access to new and advanced SPM application techniques by simply upgrading the control system. The biggest advantage comes with the Nanonis Oscillation Control Module, which adds the power of a high performance digital PLL to the Veeco MultiMode.

The AKVM4 is an adaptation kit to connect the Nanonis SPM control system to a Veeco MultiMode Atomic Force Microscope. This product offers most advanced and new SPM applications to the numerous owners of a Veeco MultiMode SPM by upgrading just the control system.

The AKVM4 provides the power supplies for the MultiMode head, buffering of signal lines and a redistribution of the lines of the Veeco 37-pin connector to the other components of the Nanonis SPM control system. With the Nanonis Base Package and the Nanonis High Voltage Amplifier it is possible to conduct all kinds of STM and contact-mode AFM measurements: high resolution scanning, sophisticated spectroscopy, force-distance curves and very low noise feedback control. But the main advantage of the AKVM4 comes with the Nanonis Oscillation Control Module. It brings the power of a high performance digital Phase Locked Loop (PLL), tightly integrated into the control system, to the well-known MultiMode. Whether non-contact AFM, tapping mode, constant excitation, constant amplitude or dissipation mode, a vast set of new dynamic modes is now available that has never been exploited before on this microscope.

KEY FEATURES

High resolution imaging
Advanced Force- and Bias- spectroscopy on a point, a line or a grid
Any dynamic AFM mode (with Nanonis OC4)
Kelvin Probe Force Microscopy imaging (with KPFM Software Module)
Dual-frequency tracking (with second OC4)

MADE FOR THESE METHODS
APPLICATION NOTES

MADE FOR THESE METHODS

1

SPM, STM, AFM

Scanning Probe Microscopy are methods using a probe, that interacts with a surface producing high resolution images by surface scanning of the probe

APPLICATION NOTES

Single-Scan Kelvin Probe Technique in Air with Dual Oscillation Controller

Single-Scan Kelvin Probe Technique in Air with Dual Oscillation Controller

In atomic force microscopy electrostatic forces are usually not discriminated against van-der-Waals forces. Attractive electrostatic forces cause the distance controller to retract the tip from the surface, resulting in erroneous height information in the topography image. Together with Nanonis we developed a novel solution to this longstanding problem.

Exploring Nanoelectromechanic of Ferroelectrics: PFM with Dual-OC4

Exploring Nanoelectromechanic of Ferroelectrics: PFM with Dual-OC4

Piezoresponse Force Microscopy (PFM) is now the primary technique for imaging, spectroscopy, and domain patterning in ferroelectric materials. Piezoresponse (PR) studies of ferroelectric materials has started in the beginning of 90s [1], and today undergo exponential growth due to rapidly emerging applications of ferroelectric and multiferroic materials for nonvolatile memories and data storage [2, 3]. These applications have stimulated extensive efforts toward understanding the mechanisms for polarization reversal in ferroelectrics on the nanometer scale.

Single Pass Kelvin Probe Measurement Technique in Air with Dual-OC4

Single Pass Kelvin Probe Measurement Technique in Air with Dual-OC4

The Kelvin probe technique is increasingly gaining importance in AFM measurements since it gives access not only to the topography but also to chemical information of the tip and sample. It is an extremely sensitive analytical method to detect changes in contact potential difference between different materials or chemical elements on the surface.

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