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Adaptation kit JEOL

Upgrade the latest JEOL SPM with the newest Nanonis SPM control system

Nanonis Adaptation kit for JEOL UHV SPM
Example image: Nanonis Adaptation kit for JEOL 4000 and 5200 series UHV AFM/STM

The adaptation kit for JEOL 5400 series completely replaces the original JEOL controller. It powers and controls the Z-coarse motor, power the electronics in the SPM head and calculates the deflection signals from the raw PSD-signals.

All necessary connectors are available on the back panel of the instrument meaning that the inegration is plug&play.

KEY FEATURES

  • Pin compatible adapation kit
  • Motor drive module for auto-approach, preamplifier power supply, beam deflection electronics
  • Complete replacement of original electronics
  • NC-AFM atomic resolution capability with OC4

MADE FOR THESE METHODS

1
SPM, STM, AFM
Scanning Probe Microscopy are methods using a probe, that interacts with a surface producing high resolution images by surface scanning of the probe
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